Scanning Electron Microscope
Partnering with COXEM for Advanced Microscopy Solutions. As a key player in Korea’s nano-convergence industry, COXEM provides Particle Technologies with access to innovative electron microscopy technology.

Products

Scanning Electron Microscope _ SEM
[SEM]
Tabletop SEM EM-40
The EM-40 comes with ultra-fast 5th-generation signal processing technology and provides high-quality imaging at frame rates of up to 13 fps. Four imaging modes (Fast, Slow, UltraFast, and Photo) allow the user to choose the image quality and speed that best fits their application.
[SEM]
Tabletop SEM EM-30N
Featuring our 5th generation DSP (Digital Signal Processing) technology it delivers crystal-clear, low noise images even at high magnification. Panorama Mode allows delivers wide-area scanning capability, while LV (Low Vacuum) gives you the ability to capture pristine, high-quality images of non-conductive samples without coating.
Ion Beam Polisher
Ion Beam Polisher
CP-8000+
The CP-8000+ is an advanced sample preparation tool that etches a cross section of a sample using an argon ion beam. This process avoids physical deformation and structural damage, without requiring complicated chemical processes. In addition, the system simplifies cross-sectional analysis of the sample by processing large areas from tens of um to several mm.
Ion Sputter Coater
SPT-20
The ion coater, SPT-20, is a device used for coating conductive materials (Au, Pt, Pd, Pt-Pd) onto the sample surfaces by using DC sputtering principle. Non-conductive samples are also used for observation under electron microscopes, and they are used to protect the sample surfaces from the injected electron beam and to help the electron flow. It can be used as an electrode formation of thin film type too.

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